GP2W0106YP 查看數據表（PDF） - Sharp Electronics
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GP2W0106YP Datasheet PDF : 16 Pages
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GP2W0106YP
115 kbps Transceiver
RELIABILITY
TEST ITEMS
Temperature cycling
High temperature and high
humidity storage
High temperature storage
Low temperature storage
Operation life 1
Operation life 2
Mechanical shock
Variable frequency
vibration
Reflow solder head
TEST CONDITIONS
1 cycle -20°C to 85°C
(30 minutes at each extreme)
20 cycles test
+40°C, 90% RH, 240 hours
+85°C, 240 hours
-30°C, 240 hours
+25°C, VDD = 3.3 V, 240
hours
+25°C, VDD = LEDA = 3.3 V,
240 hours, Pulse width
78.1 µs, Duty ratio 3/16
1,000 m/s2, 6 ms,
3 times/±X, ±Y, ±Z direction
200 m/s2,
100 to 2,000 to 100 Hz for
approximately 4 minutes
48 minutes/X, Y, Z direction
230°C, 5 s.
FAILURE JUDGEMENT
CRITERIA
IDD > Up × 1.2
L < Low × 0.8
IE < Low × 0.8
IE > Up × 1.2
Up: Upper
Specification Limint
Low: Lower
Specification Limint
SAMPLES
(n)
n = 22
n = 22
n = 22
n = 22
n = 11
n = 11
n = 11
n = 11
n = 11
DEFECTIVE
(c)
NOTES
c=0
1
c=0
1
c=0
1
c=0
1
c=0
1
c=0
c=0
c=0
c=0
2
NOTES:
1. The sample to be tested shall be left at normal temperature and humidity for
2 hours after it is taken out of the chamber. No dew point.
2. Refer to the ‘Precautions for Soldering’ section for temperature profile.
10
IrDA Data Sheet
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