HCTS365D 查看數據表（PDF） - Intersil

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HCTS365D

Radiation Hardened Hex Buffer/Line Driver Non-Inverting

Intersil 

Specifications HCTS365MS

TABLE 7. TOTAL DOSE IRRADIATION

CONFORMANCE

GROUPS

METHOD

TEST

PRE RAD

POST RAD

Group E Subgroup 2

5005

1, 7, 9

Table 4

NOTE:

1. Except FN test which will be performed 100% Go/No-Go.

READ AND RECORD

PRE RAD

POST RAD

1, 9

Table 4 (Note 1)

TABLE 8. STATIC BURN-IN AND DYNAMIC BURN-IN TEST CONNECTIONS

OSCILLATOR

OPEN

GROUND

1/2 VCC = 3V ± 0.5V

VCC = 6V ± 0.5V

50kHz

25kHz

STATIC BURN-IN I TEST CONNECTIONS (Note 1)

3, 5, 7, 9, 11, 1, 2, 4, 6, 8, 10, 12, 14,

-

13

15

16

-

-

STATIC BURN-IN II TEST CONNECTIONS (Note 1)

3, 5, 7, 9, 11,

8

13

-

1, 2, 4, 6, 10, 12, 14, 15,

-

-

16

DYNAMIC BURN-IN TEST CONNECTIONS (Note 2)

-

1, 8, 15

3, 5, 7, 9, 11, 13

16

2, 4, 6, 10, 12, 14

-

NOTES:

1. Each pin except VCC and GND will have a resistor of 10KΩ ± 5% for static burn-in.

2. Each pin except VCC and GND will have a resistor of 680Ω ± 5% for dynamic burn-in.

TABLE 9. IRRADIATION TEST CONNECTIONS

OPEN

GROUND

VCC = 5V ± 0.5V

3, 5, 7, 9, 11, 13

8

1, 2, 4, 6, 10, 12, 14 - 16

NOTE: Each pin except VCC and GND will have a resistor of 47KΩ ± 5% for irradiation testing.

Group E, Subgroup 2, sample size is 4 dice/wafer 0 failures.

Spec Number 518637

6

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