28C256 查看數據表（PDF） - Atmel Corporation
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28C256 Datasheet PDF : 14 Pages
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AT28C256
AC Read Characteristics
Symbol
tACC
tCE (1)
tOE (2)
tDF (3, 4)
tOH
Parameter
Address to Output Delay
CE to Output Delay
OE to Output Delay
CE or OE to Output Float
Output Hold from OE, CE or
Address, whichever
occurred first
AT28C256-15 AT28C256-20 AT28C256-25 AT28C256-35
Min
Max
Min
Max
Min
Max
Min
Max
150
200
250
350
150
200
250
350
0
70
0
80
0 100 0 100
0
50
0
55
0
60
0
70
0
0
0
0
Units
ns
ns
ns
ns
ns
AC Read Waveforms (1, 2, 3, 4)
Notes: 1. CE may be delayed up to tACC - tCE after the address
transition without impact on tACC.
2. OE may be delayed up to tCE - tOE after the falling
edge of CE without impact on tCE or by tACC - tOE
after an address change without impact on tACC.
Input Test Waveforms and
Measurement Level
3. tDF is specified from OE or CE whichever occurs first
(CL = 5 pF).
4. This parameter is characterized and is not 100% tested.
Output Test Load
tR, tF < 5ns
Pin Capacitance (f = 1 MHz, T = 25°C) (1)
Typ
Max
CIN
4
6
COUT
8
12
Note: 1. This parameter is characterized and is not 100% tested.
Units
pF
pF
Conditions
VIN = 0V
VOUT = 0V
2-221
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