AN5095K 查看數據表（PDF） - Panasonic Corporation
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AN5095K Datasheet PDF : 36 Pages
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AN5095K
ICs for TV
s Electrical Characteristics at Ta = 25°C (continued)
Parameter
Symbol
Conditions
Min Typ Max Unit
VIF circuit (continued) Typical input; fP = 38.9 MHz, VIN = 90 dBµ, DAC data are typical
AFT discrimination sensitivity *2 µAFT ∆f = ±25 kHz
40 57
AFT center voltage
VAFT V30 at VIN without input
4.0 4.5
AFT maximum output voltage VAFTmax V30 at f = fP −500 kHz
7.8 8.1
AFT minimum output voltage VAFTmin V30 at f = fP +500 kHz
0.3 0.8
Detection output resistance
RO41 DC measurement,
IO = − 0.4 V to −1.0 mA
70 120
SIF circuit Typical input; fS = 6.0 MHz, fM = 400 Hz, VIN = 90 dBµ
Audio detection output
(PAL, SIF1)
VSOP36 ∆f = ±50 kHz
0B-D3 = 0
0.90 1.15
75 mV/kHz
5.0 V
8.7 V
1.0 V
170 Ω
1.40 V[rms]
Audio detection output
(PAL, SIF2)
VSOP35 ∆f = ±50 kHz
0B-D3 = 0
0.90 1.15 1.40 V[rms]
Audio detection output
(PAL, SIF3)
VSOP33 ∆f = ±50 kHz
0B-D3 = 0
0.90 1.15 1.40 V[rms]
Audio detection output
NTSC/PAL
Audio detection output
linearity
RSN/P
∆VSOP
∆f = ±25 kHz
0B-D3 = 1, ratio to PAL (VSOP36)
fS = 5.5 MHz and 6.0 MHz
ratio to 6.5 MHz
−2.5 − 0.5 1.5 dB
−3 0
3
dB
SIF pull-in range
NTSC (4.5 MHz)
fSNH Pull-in range of high-pass side
(4.5M)
4.8 5.0 MHz
SIF pull-in range
NTSC (4.5 MHz)
fSNL Pull-in range of low-pass side
(4.5M)
4.0 4.2 MHz
SIF pull-in range
PAL (5.5 MHz)
fSPH Pull-in range of high-pass side
(5.5M)
5.8 6.0 MHz
SIF pull-in range
PAL (5.5 MHz)
fSPL Pull-in range of low-pass side
(5.5M)
5.0 5.2 MHz
SIF pull-in range
PAL (6.0 MHz)
fSPH Pull-in range of high-pass side
(6.0M)
6.3 6.5 MHz
SIF pull-in range
PAL (6.0 MHz)
fSPL Pull-in range of low-pass side
(6.0M)
5.5 5.7 MHz
SIF pull-in range
PAL (6.5 MHz)
fSPH Pull-in range of high-pass side
(6.5M)
6.8 7.0 MHz
SIF pull-in range
PAL (6.5 MHz)
fSPL Pull-in range of low-pass side
(6.5M)
6.0 6.2 MHz
De-emphasis terminal
output resistance (PAL)
R29P Impedance of pin 29 at PAL
32 40 48 kΩ
De-emphasis terminal
output resistance (NTSC)
R29N Impedance of pin 29 at NTSC
48 60 72 kΩ
Note) *1 to *9: Refer to "Explanation of test methods".
6
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