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M48Z32V-35MT1(2007) 查看數據表(PDF) - STMicroelectronics

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M48Z32V-35MT1
(Rev.:2007)
ST-Microelectronics
STMicroelectronics ST-Microelectronics
M48Z32V-35MT1 Datasheet PDF : 19 Pages
First Prev 11 12 13 14 15 16 17 18 19
M48Z32V
Operating modes
2.4
VCC noise and negative going transients
ICC transients, including those produced by output switching, can produce voltage
fluctuations, resulting in spikes on the VCC bus. These transients can be reduced if
capacitors are used to store energy which stabilizes the VCC bus. The energy stored in the
bypass capacitors will be released as low going spikes are generated or energy will be
absorbed when overshoots occur. A ceramic bypass capacitor value of 0.1µF (see Figure 7)
is recommended in order to provide the needed filtering.
In addition to transients that are caused by normal SRAM operation, power cycling can
generate negative voltage spikes on VCC that drive it to values below VSS by as much as
one volt. These negative spikes can cause data corruption in the SRAM while in battery
backup mode. To protect from these voltage spikes, ST recommends connecting a schottky
diode from VCC to VSS (cathode connected to VCC, anode to VSS). (Schottky diode 1N5817
is recommended for through hole and MBRS120T3 is recommended for surface mount).
Figure 7. Supply voltage protection
VCC
VCC
0.1μF
DEVICE
VSS
AI02169
11/19

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