74HCT74D-Q100 查看數據表（PDF） - NXP Semiconductors.
零件编号
产品描述 (功能)
生产厂家
74HCT74D-Q100 Datasheet PDF : 19 Pages
| |||
74HC74-Q100; 74HCT74-Q100
Dual D-type flip-flop with set and reset; positive edge-trigger
Rev. 3 — 4 December 2015
Product data sheet
1. General description
The 74HC74-Q100; 74HCT74-Q100 are dual positive edge triggered D-type flip-flop with
individual data (nD), clock (nCP), set (nSD) and reset (nRD) inputs, and complementary
nQ and nQ outputs. Data at the nD-input, that meets the set-up and hold time
requirements on the LOW-to-HIGH clock transition, will be stored in the flip-flop and
appear at the nQ output. The Schmitt-trigger action in the clock input, makes the circuit
highly tolerant to slower clock rise and fall times. Inputs include clamp diodes. This
enables the use of current limiting resistors to interface inputs to voltages in excess of
VCC.
This product has been qualified to the Automotive Electronics Council (AEC) standard
Q100 (Grade 1) and is suitable for use in automotive applications.
2. Features and benefits
Automotive product qualification in accordance with AEC-Q100 (Grade 1)
Specified from 40 C to +85 C and from 40 C to +125 C
Input levels:
For 74HC74-Q100: CMOS level
For 74HCT74-Q100: TTL level
Symmetrical output impedance
Low power dissipation
High noise immunity
Balanced propagation delays
Specified in compliance with JEDEC standard no. 7A
ESD protection:
MIL-STD-883, method 3015 exceeds 2000 V
HBM JESD22-A114F exceeds 2000 V
MM JESD22-A115-A exceeds 200 V (C = 200 pF, R = 0 )
Multiple package options
Share Link: 