HEF4060B(2016) 查看數據表（PDF） - NXP Semiconductors.
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HEF4060B Datasheet PDF : 14 Pages
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Nexperia
HEF4060B
14-stage ripple-carry binary counter/divider and oscillator
9''
9,
*
92
'87
57
&/
DDJ
Fig 5.
Test data is given in Table 10.
Definitions for test circuit:
DUT = Device Under Test;
CL = load capacitance including jig and probe capacitance;
RT = termination resistance should be equal to the output impedance Zo of the pulse generator.
Test circuit for switching times
Table 10. Measurement point and test data
Supply voltage
Input
VDD
VI
5 V to 15 V
VSS or VDD
12. RC oscillator
tr, tf
20 ns
Load
CL
50 pF
+()%
05 IURPORJLF
56
& 5
5(;7
5W
&(;7
&W
DDH
Fig 6.
Typical formula for oscillator frequency:
fosc
=
--------------1----------------
2.3 Rt Ct
External component connection for RC oscillator
12.1 Timing component limitations
The oscillator frequency is mainly determined by Rt Ct, provided Rt << R2 and
R2 C2 << Rt Ct. The influence of the forward voltage across the input protection
diodes on the frequency is minimized by R2. The stray capacitance C2 should be kept as
small as possible. In consideration of accuracy, Ct must be larger than the inherent stray
capacitance. Rt must be larger than the LOCMOS (Local Oxidation Complementary
Metal-Oxide Semiconductor) ‘ON’ resistance in series with it, which typically is 500 at
VDD = 5 V, 300 at VDD = 10 V and 200 at VDD = 15 V.
HEF4060B
Product data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 8 — 25 March 2016
© Nexperia B.V. 2017. All rights reserved
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