AD5247 查看數據表（PDF） - Analog Devices

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AD5247

128-Position I2C Compatible Digital Potentiometer

Analog Devices 

TEST CIRCUITS

Figure 25 to Figure 30 define the test conditions used in the

product Specification tables.

DUT

A

V+

W

B

V+ = VDD

1LSB = V+/2N

VMS

Figure 25. Test Circuit for Potentiometer Divider

Nonlinearity Error (INL, DNL)

NO CONNECT

DUT

A

W

B

IW

VMS

Figure 26. Test Circuit for Resistor Position Nonlinearity Error

(Rheostat Operation; R-INL, R-DNL)

VMS2

DUT

A

W

B

IW = VDD / RNOMINAL

VW

VMS1 RW = [VMS1 – VMS2]/ IW

Figure 27. Test Circuit for Wiper Resistance

AD5247

VA

DUT

VDD A

V+

W

B

( ) V+= VDD 10%

PSRR (dB) = 20 LOG

∆V MS

∆V DD

PSS (%/%) = ∆VMS%

∆V DD%

VMS

Figure 28. Test Circuit for Power Supply Sensitivity (PSS, PSSR)

DUT

A

+15V

VIN

W

B

OP27

VOUT

–15V

Figure 29. Test Circuit for Gain vs. Frequency

NC

DUT

VDD

A

W

GND B

ICM

VCM

NC

Figure 30. Test Circuit for Common-Mode Leakage Current

Rev. 0 | Page 11 of 20

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