HA-2839/883 查看數據表（PDF） - Harris Semiconductor
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HA-2839/883 Datasheet PDF : 5 Pages
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Specifications HA-2839/883
TABLE 3. ELECTRICAL PERFORMANCE CHARACTERISTICS
Device Characterized at: VSUPPLY = ± 15V, RSOURCE = 50Ω, RLOAD = 1kΩ, CL ≤10pF, AV = +10V/V, Unless Otherwise Specified.
LIMITS
PARAMETERS
Gain Bandwidth
Product
Slew Rate
Full Power Bandwidth
Rise and Fall Time
Minimum Closed Loop
Stable Gain
Overshoot
Open Loop Output
Resistance
Quiescent Power
Consumption
SYMBOL
CONDITIONS
GBWP
+SR
-SR
FPBW
TR
TF
CLSG
VO = 200mV, fO = 5MHz
VO = 200mV,
fO = 45MHz
VO = -5V to +5V
VO = +5V to -5V
VPEAK = 10V
VO = 0V to +200mV
VO = 0V to -200mV
RL = 1kΩ, CL ≤ 10pF
+OS
-OS
ROUT
VO = 0V to +200mV
VO = 0V to -200mV
VOUT = 0V
PC
VOUT = 0V, IOUT = 0mA
NOTES
1
1
1, 4
1, 4
1, 2
1, 4
1, 4
1
1
1
1
1, 3
TEMPERATURE MIN MAX UNITS
+25oC
500
-
MHz
+25oC
450
-
MHz
+25oC
550
-
+25oC
500
-
+25oC
8.0
-
+25oC
-
10
+25oC
-
10
-55oC to +125oC
10
-
V/µs
V/µs
MHz
ns
ns
V/V
+25oC
+25oC
+25oC
-
30
%
-
30
%
-
60
Ω
-55oC to +125oC
-
450
mW
NOTES:
1. Parameters listed in Table 3 are controlled via design or process parameters and are not directly tested at final production. These param-
eters are lab characterized upon initial design release, or upon design changes. These parameters are guaranteed by characterization
based upon data from multiple production runs which reflect lot to lot and within lot variation.
2. Full Power Bandwidth guarantee based on Slew Rate measurement using FPBW = Slew Rate/(2πVPEAK ).
3. Quiescent Power Consumption based upon Quiescent Supply Current test maximum. (No load on outputs.)
4. Measured between 10% and 90% points.
TABLE 4. ELECTRICAL TEST REQUIREMENTS
MIL-STD-883 TEST REQUIREMENTS
SUBGROUPS (SEE TABLE 1)
Interim Electrical Parameters (Pre Burn-In)
1
Final Electrical Test Parameters
1 (Note 1), 2, 3, 4, 5, 6
Group A Test Requirements
1, 2, 3, 4, 5, 6
Groups C & D Endpoints
1
NOTE:
1. PDA applies to Subgroup 1 only.
Spec Number 511089-883
3-56
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